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UV photo-detector based on p-NiO thin film/n-ZnO nanorods heterojunction prepared by a simple process

机译:基于p-NiO薄膜/ n-ZnO纳米棒异质结的紫外光电探测器的简单制备

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A UV photo-detector based on p-NiO thin film/n-ZnO nanorods heterojunction was fabricated using a simple two-step fabrication process. The aqueous chemical hydrothermal and thermal evaporation methods were combined to grow the ZnO nanorods and the NiO thin film, respectively. Structural investigation indicated that well aligned ZnO nanorods with hexagonal face having a preferential orientation along the c-axis (002) have been achieved and that the NiO thin film is covering all the ZnO nanorods. X-ray photoelectron spectroscopy (XPS) was used to investigate the band alignment of the heterojunction and the valence and the conduction band offsets were determined to be 1.50 eV and 1.83 eV, respectively. The current-voltage characteristics of the p-NiO thin film/ZnO nanorods heterojunction showed a clear rectifying behavior under both dark and UV illumination conditions. The response of the heterojunction diode was excellent regarding the photocurrent generation. Although other similar heterojunction diodes demonstrated lower threshold voltage, the rectification ratio and the sensitivity of the fabricated diode were superior in comparison to other similar heterojunctions reported recently, implying the vitality of the presented two-step process. (C) 2015 Elsevier B.V. All rights reserved.
机译:使用简单的两步制造工艺制造了基于p-NiO薄膜/ n-ZnO纳米棒异质结的UV光电探测器。结合水化学水热法和热蒸发法分别生长ZnO纳米棒和NiO薄膜。结构研究表明,已经实现了具有六边形面且沿c轴具有优先方向的良好对齐的ZnO纳米棒(002),并且NiO薄膜覆盖了所有ZnO纳米棒。用X射线光电子能谱(XPS)来研究异质结的能带对准,并确定化合价和导带偏移分别为1.50 eV和1.83 eV。 p-NiO薄膜/ ZnO纳米棒异质结的电流-电压特性在黑暗和紫外线照射条件下均表现出明显的整流行为。关于光电流的产生,异质结二极管的响应非常好。尽管其他相似的异质结二极管显示出较低的阈值电压,但与最近报道的其他相似的异质结相比,所制造二极管的整流比和灵敏度更高,这暗示了所提出的两步法的生命力。 (C)2015 Elsevier B.V.保留所有权利。

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